The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2007
Filed:
Dec. 22, 2005
Bruce A. Collings, Bradford, CA;
Thomas R. Covey, Richmond Hill, CA;
Mircea Guna, Toronto, CA;
Hassan Javaheri, Richmond Hill, CA;
Alexandre V. Loboda, Toronto, CA;
Bradley B. Schneider, Bradford, CA;
Bruce A. Thomson, Toronto, CA;
Bruce A. Collings, Bradford, CA;
Thomas R. Covey, Richmond Hill, CA;
Mircea Guna, Toronto, CA;
Hassan Javaheri, Richmond Hill, CA;
Alexandre V. Loboda, Toronto, CA;
Bradley B. Schneider, Bradford, CA;
Bruce A. Thomson, Toronto, CA;
Applera Corporation, Framingham, MA (US);
MDS Inc., Concord, Ontario, CA;
Abstract
In a mass spectrometer, ions from an ion source pass through an inlet aperture into a vacuum chamber for transmitting prior to mass analysis by the mass analyzer. The configuration of the inlet aperture forms a sonic orifice or sonic nozzle and with a predetermined vacuum chamber pressure, a supersonic free jet expansion is created in the vacuum chamber that entrains the ions within the barrel shock and Mach disc. Once formed, at least one ion guide with a predetermined cross-section to essentially radially confine the supersonic free jet expansion can focus the ions for transmission through the vacuum chamber. This effectively improves the ion transmission between the ion source and the mass analyzer.