The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2007

Filed:

Jun. 13, 2005
Applicant:

Toshifumi Masaki, Tochigi-ken, JP;

Inventor:

Toshifumi Masaki, Tochigi-ken, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

In order to accurately align an eye examining portion with the center of the pupil, (a) the interval d between illumination light source images PL and PR is an interval obtained when the operation distance has been properly position-aligned by other alignment means. (b) shows an interval din a state in which the operation distance is longer than to a proper position, and (c) shows an interval din a state in which the operation distance is shorter than the proper position. Even if the operation distance fluctuates when position alignment is effected with the center of the pupil, whereby the interval becomes dand das shown in (b) and (c), a measuring portion is moved in front to rear direction and is made coincident with the reference interval d, as shown in (a), whereby a proper operation distance is obtained.


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