The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2007
Filed:
Aug. 04, 2005
Ulf Hassler, Heilsbronn, DE;
Peter Schmitt, Erlangen, DE;
Guenther Kostka, Erlangen, DE;
Abstract
A surface of a body includes a structure bounded by edges and a substantially edge-free unevenness. The structure is considered a quality impairment and the unevenness a potential quality impairment. A device includes a means for generating a height representation of the surface including the structure and the unevenness. A means for calculating a variation representation calculates the variation for every point of the height so that a high variation is obtained at a boundary of the structure and a low variation is obtained at a boundary of the unevenness. A means for detecting regions that potentially affect quality detects when a variation magnitude is smaller than a predetermined variation threshold value. These regions are examined to exclude uncritical regions and to determine the actual number of regions that affect quality. Quality control is performed on vehicle tires having structures such as inscriptions, and which also have bulges or constrictions that are substantially edge-free and uneven.