The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2007

Filed:

Nov. 20, 2001
Applicants:

Konstantin I. Boudnik, Santa Clara, CA (US);

Weiqiang Zhang, San Jose, CA (US);

Alexei Volkov, Mountain View, CA (US);

Inventors:

Konstantin I. Boudnik, Santa Clara, CA (US);

Weiqiang Zhang, San Jose, CA (US);

Alexei Volkov, Mountain View, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

Providing remote applications having built in feedback ability in a distributed test framework. A first application program having a call interface is launched using a first agent process, which includes an agent launcher interface. The call interface provides a reference to the first agent process, which allows communication between the application program and the agent process. A launch request is sent from the first application to the agent launcher interface using the reference. The launch request specifies a second application to be launched and also defines attributes of a processing resource. The second application is then launched on a processing resource having the attributes defined in the launch request.


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