The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2007

Filed:

Nov. 17, 2005
Applicants:

Charles Q. Zhan, Chandler, AZ (US);

Joseph Z. LU, Glendale, AZ (US);

Inventors:

Charles Q. Zhan, Chandler, AZ (US);

Joseph Z. Lu, Glendale, AZ (US);

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method includes identifying a signal and a disturbance using historical data associated with one or more process variables. The method also includes decomposing the signal and the disturbance at a plurality of resolution levels. The method further includes identifying a plurality of points associated with the decomposed signal using the decomposed signal and the decomposed disturbance. In addition, the method includes selecting at least some of the points and extracting a plurality of data segments from the signal, where the data segments are associated with the selected points.


Find Patent Forward Citations

Zhan, Charles. (2007). Apparatus and method for identifying informative data in a process control environment (U.S. Patent No. 7257501). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7257501

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…