The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2007
Filed:
Jan. 13, 2005
Masayasu Narimatsu, Kyoto, JP;
Masakatsu Hayashi, Kashiba, JP;
Hiroshi Kawamoto, Tenri, JP;
Makoto Uehara, Nara, JP;
Jitsuo Masuda, Yamatotakada, JP;
Masayasu Narimatsu, Kyoto, JP;
Masakatsu Hayashi, Kashiba, JP;
Hiroshi Kawamoto, Tenri, JP;
Makoto Uehara, Nara, JP;
Jitsuo Masuda, Yamatotakada, JP;
Sharp Kabushiki Kaisha, Osaka, JP;
Abstract
In case of a developing density correction based on a test image (patch image) density, normally, the developing density is carried out in a short period of time by correction (γ correction) of a developing bias and a grid voltage (S). When a correction amount of the γ correction exceeds an ordinary range, the γ correction (S) and adjustment of toner concentration (magnetic permeability reference value) (S) are carried out in combination. Furthermore, when the toner concentration is changed, the setting of a correction reference of the γ correction (γ correction TBL) and correction timing of the γ correction are accordingly changed (S, S). Therefore, in the developing density correction based on the test image density in the developing device using binary developer, it is possible to carry out the developing density correction, which is carried out in a short time, and whose correction width is wide, while maintaining the accuracy of a developing density adjustment.