The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2007
Filed:
Dec. 01, 2003
Yun Chur Chung, Daejeon, KR;
Chun Ju Youn, Gyeonggi-do, KR;
Keun Joo Park, Jeollanam-do, KR;
Jun Haeng Lee, Gyeonggi-do, KR;
Yun Chur Chung, Daejeon, KR;
Chun Ju Youn, Gyeonggi-do, KR;
Keun Joo Park, Jeollanam-do, KR;
Jun Haeng Lee, Gyeonggi-do, KR;
Korea Advanced Institue of Science and Technology, Yuseong-gu, KR;
Abstract
Disclosed is an apparatus for monitoring an optical signal-to-noise ratio in a WDM optical network. The apparatus includes an orthogonal polarization component module for receiving an optical signal and outputting it after removing a signal component thereof at a specific frequency band; and calculation means for measuring both average signal and noise component intensity of the optical signal outputted from the orthogonal polarization component module. By removing a signal component at a specific frequency bandwidth and passing only a noise component through, it is possible to easily measure the noise intensity within a signal bandwidth that cannot be measured in general. A frequency band is set within a signal bandwidth, and the signal intensity is minimized at the set frequency band, so that it is possible to measure the optical signal-to-noise ratio even for a signal whose amplified spontaneous emission noise spectrum is not flat, irrespective of the signal pattern length.