The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2007

Filed:

Feb. 24, 2004
Applicant:

Michael I. Miga, Franklin, TN (US);

Inventor:

Michael I. Miga, Franklin, TN (US);

Assignee:

Vanderbilt University, Nashville, TN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image reconstruction algorithm begins with an initial acquisition of a preoperative imaging volume followed by a second imaging sequence subsequent to an applied deformation. A computational domain (model) is generated from the preoperative image series and boundary conditions are derived from a pre-post deformation comparison, as well as from information gathered from deformation source application (i.e., displacement and/or force). Using boundary conditions, a series of model-based image deformations is accomplished while varying model material properties. A calculation of a Jacobian matrix relating the change in regional mutual information is performed with respect to the change in material properties. Upon completion of this process, matrix regularization techniques are used to condition the system of equations and allow for inversion and subsequent delivery of model-property adjustments.


Find Patent Forward Citations

Loading…