The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7257188 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 14, 2007

Filed:

Feb. 28, 2005
Applicant:

Paul Bjorkholm, Newport Beach, NY (US);

Inventor:

Paul Bjorkholm, Newport Beach, NY (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/06 (2006.01); H05G 1/64 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one embodiment, a method of examining contents of an object is disclosed comprising scanning an object at first and second radiation energies, detecting radiation at the first and second energies, and calculating a function of the radiation detected at the first and second energies, for corresponding pixels. A pixel is a projection of radiation through the object onto the detector. The first functions of a plurality of pixels are grouped and a second function of the group is analyzed to determine whether the object at least potentially contains material having an atomic number greater than the predetermined atomic number. The second function may be compared to a third function, which may be a threshold having a value based, at least in part, on material having a predetermined atomic number. Systems are also disclosed.


Find Patent Forward Citations

Bjorkholm, Paul. (2007). Dual energy radiation scanning of contents of an object (U.S. Patent No. 7257188). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7257188

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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