The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2007

Filed:

Apr. 09, 2004
Applicants:

Joachim Bihr, Dirgenheim, DE;

Alfons Abele, Schwäbisch-Gmünd, DE;

Inventors:

Joachim Bihr, Dirgenheim, DE;

Alfons Abele, Schwäbisch-Gmünd, DE;

Assignee:

Carl-Zeiss-Stiftung, Oberkochen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A tilting system for an observation device, in particular for a microscope, with at least one objective device and at least one optical device for passing at least one beam path from an entrance region to an exit region of the tilting system is described, wherein the optical device has at least one optical element in the form of a prism for tilting and for image reversion of the beam path as well as for guiding it further into at least one ocular device. According to the invention, a particularly cost-favorable and structurally simple configuration of the tilting system with a mechanical structural length that is simultaneously as small as possible is provided by configuring the optical elements for tilting the beam path as well as at least one prism for image reversion in a special way and by arranging them in a specific manner relative to one another in the beam path. In addition, an observation device with a corresponding tilting system is described.


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