The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2007
Filed:
Jun. 25, 2003
James Zhixin Chang, Vancouver, WA (US);
James Zhixin Chang, Vancouver, WA (US);
Sharp Laboratories of America, Inc, Camas, WA (US);
Abstract
A method is provided for adaptively generating perceptually uniform printer characterization samples in a three-dimensional (3-D) signal space. The method comprises: generating lines, each including a plurality of samples, in a printer 3-D signal space; printing signal space color targets; measuring the signal space color targets; generating lines with a plurality of perceptually uniform samples; generating polygon shapes in the 3-D signal space from the perceptually uniform sampled lines; calculating addition perceptually uniform sample points associated with each polygon; and, generating a final target in the printer 3-D signal space using the calculated perceptually uniform sample points. In one aspect, generating lines, includes: for each line, generating a metric distance function; creating a plurality of perceptually uniform samples on the function output axis; and, using the inverse of the metric distance function, mapping perceptually uniform samples onto the line.