The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2007
Filed:
Sep. 16, 2003
Christian Muehlig, Jena, DE;
Wolfgang Triebel, Jena-Cospeda, DE;
Jochen Alkemper, Kleinwinternheim, DE;
Regina Martin, Jena, DE;
Christian Muehlig, Jena, DE;
Wolfgang Triebel, Jena-Cospeda, DE;
Jochen Alkemper, Kleinwinternheim, DE;
Regina Martin, Jena, DE;
Schott AG, Mainz, DE;
Abstract
The method tests the suitability of an optical material having a radiation-induced absorption, especially of an alkali or alkaline earth halide, for production of an optical element exposed to high-energy irradiation. The method includes pre-irradiating the optical material with laser radiation until rapid damage induced in the optical material with the laser radiation is saturated; subsequently measuring fluorescence of the optical material during and/or immediately after irradiating the optical material with excitation radiation and determining the non-intrinsic fluorescence and intrinsic fluorescence present in the measured fluorescence. Suitability may be preferably determined according to a ratio of the amount of non-intrinsic fluorescence to intrinsic fluorescence. A device for performing the method including a barrier device for blocking scattered excitation radiation is also provided.