The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2007
Filed:
Dec. 20, 2002
Seizo Suzuki, Kanagawa, JP;
Masaaki Ishida, Kanagawa, JP;
Atsufumi Omori, Kanagawa, JP;
Magane Aoki, Kanagawa, JP;
Yasuhiro Nihei, Kanagawa, JP;
Seizo Suzuki, Kanagawa, JP;
Masaaki Ishida, Kanagawa, JP;
Atsufumi Omori, Kanagawa, JP;
Magane Aoki, Kanagawa, JP;
Yasuhiro Nihei, Kanagawa, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
An optical scan device having an optical deflector reflecting a light beam from a light beam source so as to deflect the light beam and having a surface to be scanned on which information is written such that the light beam deflected by the deflector scans the surface is disclosed. Optical detectors are arranged at least in two locations, a start side of writing and an end side of writing, which locations are outside an effective writing area. A measuring part measures a scan time required by the light beam deflected by the optical deflector to scan a range between the optical detectors. A correcting part corrects each dot position of image data in the effective writing area to an arbitrary position based on a variation amount of the measured scan time.