The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2007

Filed:

Sep. 26, 2003
Applicant:

Hiroyuki Shioya, Tokyo, JP;

Inventor:

Hiroyuki Shioya, Tokyo, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image processing apparatus for finding reflectivity based on a BRDF model expressing a ratio of reflection of light incident upon one point of a surface of an object to be drawn at the object surface, the image processing apparatus having an operation unit for calculating the reflectivity based on a BRDF model calculated by a quadratic-form matrix expression including a vector comprised of a light source direction vector, a viewpoint direction vector, and a normal direction vector and a matrix determining the characteristics of the BRDF model, thereby able to achieve both a variety of expression power and good operation efficiency when mounted in a programmable pixel shader and further having enough of a compactness to easily cope with a shift-variant BRDF, and a method of the same.


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