The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2007

Filed:

Sep. 24, 2004
Applicants:

Dan-hui Dorothy Yang, Sunnyvale, CA (US);

Jennifer LU, Sunnyvale, CA (US);

Ying-lan Chang, Cupertino, CA (US);

Timothy H. Joyce, Mountain View, CA (US);

Inventors:

Dan-Hui Dorothy Yang, Sunnyvale, CA (US);

Jennifer Lu, Sunnyvale, CA (US);

Ying-Lan Chang, Cupertino, CA (US);

Timothy H. Joyce, Mountain View, CA (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention provides an apparatus that produces analyte ions for detection by a detector. The apparatus includes a matrix based ion source having a target substrate including a carbon nanotube material for producing analyte ions, an ion transport system adjacent to the matrix based ion source for transporting analyte ions from the matrix based ion source; and an ion detector downstream from the ion transport system for detecting the analyte ions. The invention also provides a method for producing and detecting the analyte ions.


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