The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2007

Filed:

Mar. 02, 2004
Applicants:

Tomonari Sendai, Kaisei-machi, JP;

Satoshi Arakawa, Kaisei-machi, JP;

Masayuki Murakami, Old Greenwich, CT (US);

Inventors:

Tomonari Sendai, Kaisei-machi, JP;

Satoshi Arakawa, Kaisei-machi, JP;

Masayuki Murakami, Old Greenwich, CT (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01); G12B 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A phantom, adapted to be radiation-imaged to obtain a radiation image for evaluation in inspection of a radiation imaging system, is capable of performing both the quantitative evaluation and the visual evaluation of the radiation image easily with a low cost and increasing accuracy of the constancy evaluation of the radiation imaging system. The phantom includes a base plate; a first member disposed on the base plate and having a first image quality evaluating pattern formed thereon to be used for visual evaluation as to a predetermined image quality evaluation item; and a second member disposed on the base plate and having a second image quality evaluating pattern formed thereon to be used for quantitative evaluation as to the predetermined image quality evaluation item.


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