The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2007
Filed:
Nov. 06, 2003
Neal S. Young, Washington, DC (US);
Sachiko Kajigaya, Rockville, MD (US);
Neal S. Young, Washington, DC (US);
Sachiko Kajigaya, Rockville, MD (US);
Abstract
Methods are provided herein for measuring the mutational frequency of a DNA molecule in cells, for example stem cells or hematopoietic cells such as CD34cells or granulocytes. The method includes sequencing corresponding regions of mtDNA from a set of hematopoietic cells, or a set of clonal populations of hematopoietic cells, and comparing the sequence of the corresponding regions of mtDNA from the cells, or clonal populations of cells. The method also includes the comparison of mtDNA sequences with genomic DNA sequences. Also provided are methods for screening for an agent that has a mutagenic effect on a cell. The method includes contacting, or treating, clonal populations of cells with an agent and comparing the sequence of the mtDNA obtained from the treated clonal populations of cells, with the sequence of the corresponding region of mtDNA obtained from a control clonal populations of cells.