The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2007

Filed:

Jul. 28, 2004
Applicants:

Peijun Cong, San Jose, CA (US);

Shenheng Guan, Palo Alto, CA (US);

Stephen Cypes, San Jose, CA (US);

Jason Wells, San Francisco, CA (US);

H. Sam Bergh, San Francisco, CA (US);

Inventors:

Peijun Cong, San Jose, CA (US);

Shenheng Guan, Palo Alto, CA (US);

Stephen Cypes, San Jose, CA (US);

Jason Wells, San Francisco, CA (US);

H. Sam Bergh, San Francisco, CA (US);

Assignee:

Symyx Technologies, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/10 (2006.01); G01K 11/00 (2006.01); G01K 13/02 (2006.01); G01K 25/00 (2006.01); G01N 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A library of material samples is provided in a condition suitable for imaging using infrared (IR) spectroscopy. The samples are provided to one or more detection cells, each of the cells including or containing a reflective surface. Preferably, for imaging, an energy source (e.g. a source of infrared radiation) provides energy to the detection cells to interact with the samples. Thereafter, images (e.g., spectra) related to the samples are created based upon the interaction.


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