The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2007

Filed:

Mar. 28, 2003
Applicants:

Mark David Osborn, Schenectady, NY (US);

Rasiklal Punjalal Shah, Latham, NY (US);

Jieqian Cathy Chen, Palo Alto, CA (US);

Inventors:

Mark David Osborn, Schenectady, NY (US);

Rasiklal Punjalal Shah, Latham, NY (US);

Jieqian Cathy Chen, Palo Alto, CA (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A technique is provided for selecting among a plurality of service models for addressing serviceable events and faults in a complex machine system. Indicators established for each of the models serve as the basis for comparison to input data acquired from the complex system or from manual or semi-automated data acquisition methods. Based upon the comparisons, and upon flexible selection criteria, one or more of the service models is selected to most efficiently address the most likely root cause of the serviceable event or fault.


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