The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2007

Filed:

Jan. 20, 2006
Applicants:

David Ohsie, Baltimore, MD (US);

Salvatore Desimone, Woodbury, CT (US);

Nelson Ferreira, New Rochelle, NY (US);

Eyal Yardeni, Ardsley, NY (US);

Inventors:

David Ohsie, Baltimore, MD (US);

Salvatore DeSimone, Woodbury, CT (US);

Nelson Ferreira, New Rochelle, NY (US);

Eyal Yardeni, Ardsley, NY (US);

Assignee:

EMC Corporation, Hopkinton, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus are provided for correlating events in a system. Problems and other events can, e.g., be detected in a system that generates symptoms or observable events. A computer-accessible codebook is provided that includes a mapping between each of a plurality of groups of possible symptoms and one of a plurality of likely exceptional events (e.g., problems) in the system. The system is monitored and one or more known symptoms generated by the system are detected. A mismatch measure is determined between each of the plurality of groups of possible symptoms in the mapping and the one or more known symptoms using a computer, while disregarding symptoms in the groups of possible symptoms not determined to be known. One or more of the plurality of likely problems is selected corresponding to one of the plurality of groups having the smallest mismatch measure.


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