The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2007
Filed:
Aug. 08, 2003
Hans-dieter Oberle, Puchheim, DE;
Sebastian Sattler, München, DE;
Hans-Dieter Oberle, Puchheim, DE;
Sebastian Sattler, München, DE;
Infineon Technologies AG, , DE;
Abstract
To determine the period length of a first signal, the length is measured by counting the periods of a second signal with a shorter period length. To measure the fluctuations of the period length of the first signal whilst also taking into account the fluctuations of the period length of the second signal, the measurement is carried out for two different values of the period length of the second signal. Both the fluctuations of the period length of the first signal and the accumulated fluctuations of the period length of the second signal are calculated independently of one another from the two values. The method enables the period length fluctuations of a first signal that originates from a phase-locked loop to be detected.