The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2007
Filed:
Feb. 02, 2004
Shan Zhong, Ellicott City, MD (US);
Vladimir Pelekhaty, Pikesville, MD (US);
Jean-luc Archambault, Severna Park, MD (US);
Shan Zhong, Ellicott City, MD (US);
Vladimir Pelekhaty, Pikesville, MD (US);
Jean-Luc Archambault, Severna Park, MD (US);
CIENA Corporation, Linthicum, MD (US);
Abstract
A universal in-service monitoring scheme to monitor performances of optical networks, including elements that make up the optical network, is proposed. The elements may be a wavelength selective switch or an optical cross connect. In this scheme, a small tunable probe signal is injected into the optical network via an input of the network. An output signal is received at the output and processed to determine if the probe signal is contained within the output signal. The scheme is such that probe signal injection and detection devices need not be physically co-located. Thus, the scheme is useful to test even optical network that spans thousands of miles. The probe signal is non-interfering with the network traffic so the network can be providing service while its performance is monitored. As examples of the probe signal detection mechanisms include lock-in amplification and coherent detection.