The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2007
Filed:
Dec. 30, 2002
Applicants:
Jeffrey Kempf, Dallas, TX (US);
Arnold P. Skoog, Carrollton, TX (US);
Roger M. Ikeda, Plano, TX (US);
Inventors:
Jeffrey Kempf, Dallas, TX (US);
Arnold P. Skoog, Carrollton, TX (US);
Roger M. Ikeda, Plano, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G 5/00 (2006.01); G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of reducing ringing artifacts in image data that has been filtered with a high frequency emphasis filter. For each filtered data value, a local variance is calculated from data values at neighboring filter taps. This variance is compared to a threshold, and if the threshold is exceeded, the filtered data value is limited between local minimum and maximum values. A method of reducing noise, also using the local variance, is also described.