The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2007
Filed:
Mar. 28, 2006
Masashi Ueda, Nagoya, JP;
Takuma Kuno, Nagoya, JP;
Masashi Ueda, Nagoya, JP;
Takuma Kuno, Nagoya, JP;
Brother Kogyo Kabushiki Kaisha, Nagoya-shi, Aichi, JP;
Abstract
A method of evaluating the quality of an image includes a step of determining at least a parameter concerning a zone or a parameter concerning a distribution pattern of sampling points within the zone. This step is performed based on the image. For each zone, Fourier analysis is performed using the optical characteristic values of the respective sampling points within the zone, and the image quality of each zone is obtained. The quality of the image is then determined based on the image quality of each zone within the image. A suitable zone and distribution pattern of sampling points are employed in evaluating the quality of an image.