The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2007

Filed:

Sep. 14, 2004
Applicants:

Frank Hunt, West Bloomfield, MI (US);

Kaname Sasaki, Farmington Hills, MI (US);

Shigeru Oho, Farmington Hills, MI (US);

Inventors:

Frank Hunt, West Bloomfield, MI (US);

Kaname Sasaki, Farmington Hills, MI (US);

Shigeru Oho, Farmington Hills, MI (US);

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for performing computed tomography having a radiation source and at least one radiation detector spaced from the radiation source and which generates an output signal representative of the strength of the received radiation from the radiation source. A part support for holding a plurality of parts is positioned in between the radiation source and the detectors. The part support is rotatably mounted about an axis generally perpendicular to a vector between the radiation source and the detectors so that, upon rotation of the part support, the radiation detectors generate an output signal corresponding to the internal structure of parts supported on the part support. A computer system receives the output signals from the detectors and, under program control, generates a report of the internal structure of the parts on the part support.


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