The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2007

Filed:

Jul. 13, 2004
Applicant:

Akinori Araya, Yokohama, JP;

Inventor:

Akinori Araya, Yokohama, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

A scanning laser microscope is provided which includes at least one laser light source for emitting laser light, a plurality of modulating sections for adjusting the laser light emitted from each laser light source, a storage section for storing delay time information on an input/output of each modulating section, and signal production section for producing a driving signal to drive at least one modulating section selected from the plurality of modulating sections based on the delay time information of the at least one selected modulating section. The delay time information includes information on a response time from a start of driving to development of a function of each modulating section.


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