The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2007
Filed:
Jul. 22, 2004
Christopher M. Vaccaro, O Fallon, MO (US);
Roger W. Engelbart, St. Louis, MO (US);
Nancy L. Wood, Clayton, MO (US);
Christopher M. Vaccaro, O Fallon, MO (US);
Roger W. Engelbart, St. Louis, MO (US);
Nancy L. Wood, Clayton, MO (US);
The Boeing Company, Chicago, IL (US);
Abstract
A system for non-destructive inspection using laser profiling and an associated method are provided. The system includes a support surface, and at least one laser carried by the support surface and directed towards the workpiece at an oblique angle such that at least a portion of the workpiece is illuminated by the laser. The system also includes a camera carried by the support surface and capable of capturing reflections from the workpiece, as well as a translation device capable of traveling proximate to the workpiece. The support surface is coupled to the translation device such that the laser and the camera are capable of traveling along the workpiece. The system further includes a data acquisition system capable of communicating with the camera such that the data acquisition system creates an image indicative of at least a portion of the workpiece based on the reflections from the workpiece.