The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2007

Filed:

May. 23, 2003
Applicants:

Tsugio Wakita, Matsuyama, JP;

Hiroyuki Hamamoto, Imabari, JP;

Inventors:

Tsugio Wakita, Matsuyama, JP;

Hiroyuki Hamamoto, Imabari, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

It is an object of the present invention to provide an analysis device which can reproduce an image of an analysis object more accurately even when an analysis disc is an optical disc having the analysis object therein. A second pickup () is provided for capturing and tracing a track on an analysis disc (), and a first pickup () is provided which is fixed at a constant distance (L) from the second pickup () on the disc. A signal identical to the tracking signal of the second pickup () is applied to a tracking actuator for driving the optical path of the first pickup () in the radial direction of the analysis disc. A part of an analysis object () is traced and read while the position of the second pickup () in the radial direction is controlled at times.


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