The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2007

Filed:

Feb. 10, 2005
Applicants:

István Magai, Biatorbágy, HU;

Ferenc Fazekas, Budapest, HU;

Inventors:

István Magai, Biatorbágy, HU;

Ferenc Fazekas, Budapest, HU;

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 25/00 (2006.01); B23K 11/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a method for qualifying an electric circuit having at least one contact, a reference function of thermoelectric voltage versus time of a faultless electric circuit is provided. The circuit is heated by at least one measuring electric impulse. Thermoelectric-voltage-versus-time data of the electric circuit is acquired. The circuit is qualified based on the differences between the acquired data and the reference function. Additionally, in a method for localizing a weak or bad contact of an electric circuit, the circuit is heated by at least one measuring electric impulse, and thermoelectric-voltage-versus-time data of the circuit is acquired. The acquired data is then compared to reference functions of thermoelectric voltage versus time data of known circuits with weak or bad contacts. The weak or bad contact of the circuit is localized in accordance with the similarities between the acquired data and the reference functions.


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