The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2007
Filed:
Dec. 19, 2006
Robert Freedman, Houston, TX (US);
Krishnamurthy Ganesan, Sugar Land, TX (US);
Robert Freedman, Houston, TX (US);
Krishnamurthy Ganesan, Sugar Land, TX (US);
Schlumberger Technology Corporation, Sugar Land, TX (US);
Abstract
A method for determining a property of a substance in a downhole measurement region includes the following steps: providing a static magnetic field having a static magnetic field gradient in the measurement region; applying, in the measurement region, a pulse sequence that includes a tipping pulse, a re-focusing pulse, and a pulsed field gradient pulse train; wherein the pulsed field gradient pulse train includes a first portion and a second portion; the first portion comprising a first pulse or set of pulses having a first polarity and a second pulse or set of pulses having a second polarity, the second polarity being opposite to the first polarity, and wherein the first portion occurs before the re-focusing pulse; the second portion comprising a third pulse or set of pulses having the first polarity and a fourth pulse or set of pulses having the second polarity, and wherein the second portion occurs after the re-focusing pulse; and receiving one or more spin echoes from the measurement region.