The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2007
Filed:
Jul. 18, 2005
Aik Koon Loh, Singapore, SG;
Roy Williams, Fort Collins, CO (US);
Keen Fung Jason Wai, Singapore, SG;
Chen NI Low, Singapore, SG;
Yi Jin, Singapore, SG;
Rex Shang, Fort Collins, CO (US);
Tiam Hock Joseph Tan, Singapore, SG;
Daniel Z Whang, Singapore, SG;
Aik Koon Loh, Singapore, SG;
Roy Williams, Fort Collins, CO (US);
Keen Fung Jason Wai, Singapore, SG;
Chen Ni Low, Singapore, SG;
Yi Jin, Singapore, SG;
Rex Shang, Fort Collins, CO (US);
Tiam Hock Joseph Tan, Singapore, SG;
Daniel Z Whang, Singapore, SG;
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
A method and apparatus for maximizing the usage of a testhead of an in-circuit tester is presented. A testhead execution supervisor interfaces between a testhead controller and a graphical user interface used to enter manual tests. The testhead execution supervisor adds tests to be submitted to the testhead to one or more queues according to a priority scheme. Tests may be submitted to the testhead execution supervisor both as manual tests entered via the graphical user interface and as automatically generated tests generated by an automatic debug module. The automatic debug module may automatically generate tests for execution by the testhead that are executed when the testhead is idle, for example when no higher priority manual tests are scheduled.