The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2007

Filed:

Jun. 24, 2004
Applicants:

Peter M. Osucha, Knoxville, TN (US);

David K. Swindell, Knoxville, TN (US);

Jack R. Lee, Lenoir City, TN (US);

Inventors:

Peter M. Osucha, Knoxville, TN (US);

David K. Swindell, Knoxville, TN (US);

Jack R. Lee, Lenoir City, TN (US);

Assignee:

Energy Technologies, Inc., Knoxville, TN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/222 (2006.01); G01F 23/00 (2006.01); G01N 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and apparatus for continuous real-time measurement of bulk material using gamma irradiation. A multi-energy gamma attenuation device monitors bulk material flow and produces a spectrum that is compared to a baseline spectrum to produce a relative weight/impurity/component ratio. A sample analysis, in combination with measurement of the relative weight/impurity/component ratio of the sample, allows for determination of the coefficients for determining the absolute weight/impurity/component values of the bulk material.


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