The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2007

Filed:

Nov. 01, 2004
Applicants:

Daniel E. Archer, Livermore, CA (US);

S. John Luke, Pleasanton, CA (US);

G. Joseph Mauger, Livermore, CA (US);

Vincent J. Riot, Berkeley, CA (US);

David A. Knapp, Livermore, CA (US);

Inventors:

Daniel E. Archer, Livermore, CA (US);

S. John Luke, Pleasanton, CA (US);

G. Joseph Mauger, Livermore, CA (US);

Vincent J. Riot, Berkeley, CA (US);

David A. Knapp, Livermore, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 40/14 (2006.01); G01J 1/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A digital list mode multichannel analyzer (MCA) built around a programmable FPGA device for onboard data analysis and on-the-fly modification of system detection/operating parameters, and capable of collecting and processing data in very small time bins (<1 millisecond) when used in histogramming mode, or in list mode as a list mode MCA.


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