The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7251991 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 07, 2007

Filed:

Oct. 19, 2004
Applicants:

Maximilian Sergio, Sasso Marconi, IT;

Nicolò Manaresi, Bologna, IT;

Marco Tartagni, Meldola, IT;

Roberto Guerrieri, Bologna, IT;

Roberto Canegallo, Tortona, IT;

Inventors:

Maximilian Sergio, Sasso Marconi, IT;

Nicolò Manaresi, Bologna, IT;

Marco Tartagni, Meldola, IT;

Roberto Guerrieri, Bologna, IT;

Roberto Canegallo, Tortona, IT;

Assignee:

STMicroelectronics S. R. L., Agrate Brianza (MI), IT;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 17/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A measurement technique determines the physical features of a tire such as a determination of the deformation a tire undergoes during use. The measurement technique utilizes a first belt, or first and second belts, in the tire reinforced with a plurality of metallic wires and involves the steps of providing a signal between a first and a second metallic wire associated with the first or first and second belts. The measurement technique determines a real part and an imaginary part of the impedance between the first and second metallic wires, which is proportional to the forces acting on the tire.


Find Patent Forward Citations

Sergio, Maximilian. (2007). Method for determination of the physical features of a tire (U.S. Patent No. 7251991). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7251991

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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