The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2007
Filed:
Dec. 25, 2002
Toshiro Ishida, Gotemba, JP;
Toshiro Ishida, Gotemba, JP;
Tetra Laval Holdings & Finance S.A., Pully, CH;
Abstract
A sealed condition inspecting device comprising a support unit for supporting an element to be inspected for a sealed condition, a pair of electrodes in contact with the portion to be inspected of the element to be inspected and supported by the support unit, an electrical variable detecting unit for detecting an electrical variable in the portion to be inspected, and a sealed condition judging means for judging the acceptability of a sealed condition based on the electrical variable. In fact, since the acceptability of a sealed condition is judged based on an electrical variable in the portion, to be inspected, whether or not a defective sealed condition has occurred can be determined independently of the subjectivity of the operator, whereby a sealed condition can be inspected for a sealed condition without unpacking them, not only inspection work can be simplified but reliability in the quality of an element to be inspected can be improved.