The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2007
Filed:
Feb. 02, 2004
Applicant:
Paul J. Steffan, Elk Grove, CA (US);
Inventor:
Paul J. Steffan, Elk Grove, CA (US);
Assignee:
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for facilitating semiconductor wafer lot disposition includes providing detailed descriptive information of the semiconductor wafer layout and generating data concerning at least one defect in the semiconductor wafers at an intermediate processing stage. At least one layer model is generated from the information and data to disclose the effects of the defect upon at least one later layer of the semiconductor wafers. The layer model is utilized to determine the subsequent disposition of the wafer lot.