The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2007
Filed:
Aug. 11, 2003
Wataru Itoh, Kyoto, JP;
Tomohiko Kanemitsu, Osaka, JP;
Takeru Yamashita, Osaka, JP;
Akihiko Watanabe, Osaka, JP;
Wataru Itoh, Kyoto, JP;
Tomohiko Kanemitsu, Osaka, JP;
Takeru Yamashita, Osaka, JP;
Akihiko Watanabe, Osaka, JP;
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Abstract
An assembly for an LSI test supplies a test signal output from an LSI tester to a target LSI to be tested and outputs, to the LSI tester, a test result signal generated by processing of the target LSI performed in accordance with the test signal. The assembly for an LSI test includes: a peripheral circuit coupled to the target LSI and allowing the target LSI to operate in the same manner as in the application environment; and a printed circuit board on which the peripheral circuit is mounted.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile