The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2007
Filed:
Jan. 21, 2004
Oswin Housty, Austin, TX (US);
Oswin Housty, Austin, TX (US);
Advanced Micro Devices Inc., Sunnyvale, CA (US);
Abstract
Methods and apparatus are provided for use in testing a memory () in a multiprocessor computer system (). The multiprocessor computer system () has a plurality of processing nodes (-) coupled in an array wherein each processing node is coupled to at least one other processing node, and a memory () distributed among the plurality of processing nodes (-). A configuration of the array is determined. An initial configuration of the memory () is also determined. The memory () is tested over the array according to the initial configuration to identify a bad memory element. The initial configuration is modified to form a revised configuration that excludes the bad memory element.