The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 31, 2007

Filed:

Jan. 26, 2005
Applicants:

P. German Avila, Philadelphia, PA (US);

William F. Hoffman, Iii, Palatine, IL (US);

Kurk W. Kan, Schaumburg, IL (US);

Andrew M. Wertkin, Wyndmoor, PA (US);

Inventors:

P. German Avila, Philadelphia, PA (US);

William F. Hoffman, III, Palatine, IL (US);

Kurk W. Kan, Schaumburg, IL (US);

Andrew M. Wertkin, Wyndmoor, PA (US);

Assignee:

Synapsis Enterprise LLC, Springhouse, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A01K 5/02 (2006.01); G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods, systems, and computer program products for analyzing a product are disclosed. The product includes parts supplied by suppliers. Each part includes materials, each material includes substances, and each substance has a respective substance amount. A database includes relationship information for the product, parts, materials, substances and substance amounts. The product is analyzed by, first, receiving instructions to select at least one of the product, the parts, or the materials for analysis. Next, responsive to the received instructions, relationship information is retrieved from the database for the selected product, parts, and materials. Finally, the retrieved relationship information is processed to determine at least one of (1) a materials breakdown or (2) a compliance status for the selected product, parts, or materials.


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