The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 31, 2007

Filed:

Jun. 16, 2005
Applicant:

Takayuki Nakamura, Yamatokoriyama, JP;

Inventor:

Takayuki Nakamura, Yamatokoriyama, JP;

Assignee:

Mori Seiki, Co., Ltd., Yamatokoriyama-shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Interference checking device including: a modeling database that stores data for three-dimensional modeling of tools, workpieces, and machine-tool constituting structures; an interference data memory for storing interference data defining inter-component interference relationships among the tool, the workpiece, and the structures; and an interference checking processor that, based on structure movement commands sent from a program analyzer for the machine tool, and on data stored in the modeling database and interference data memory, determines whether the tool, the workpiece, and the structures will interfere with each other. Movement commands in a block at least one block succeeding the block being executed in order to control the drive mechanisms that move the structures are sent from the program analyzer to the interference checking processor.


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