The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 31, 2007

Filed:

Jun. 25, 2002
Applicants:

Siu-wai Wu, San Diego, CA (US);

Vincent Liu, San Diego, CA (US);

Yong He, San Diego, CA (US);

Inventors:

Siu-Wai Wu, San Diego, CA (US);

Vincent Liu, San Diego, CA (US);

Yong He, San Diego, CA (US);

Assignee:

General Instrument Corporation, Horsham, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/12 (2006.01); H04B 1/66 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and apparatus for statistical multiplexing in a dual pass encoding scheme are provided. A first pass encoder encodes alternate slices of anchor frames as I-slices and P-slices respectively in order to generate statistics for both I and P frame encoding for the same anchor frame. A second pass encoder determines the encoding complexity estimates for a plurality of frames in a look-ahead pipeline and sums the encoding complexity estimates of selective frames in the look-ahead pipeline to determine the initial need parameter for a current frame to be encoded. The second pass encoder computes a need parameter for encoding the current frame based on the initial need parameter. The need parameter is used by a statmux processor to determine the encoding bit rate for second pass encoding of the current frame.


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