The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 31, 2007

Filed:

Jun. 10, 2004
Applicants:

Ed Hsia, Saratoga, CA (US);

Darlene Hamilton, San Jose, CA (US);

Fatima Bathul, Cupertino, CA (US);

Masato Horiike, Sunnyvale, CA (US);

Inventors:

Ed Hsia, Saratoga, CA (US);

Darlene Hamilton, San Jose, CA (US);

Fatima Bathul, Cupertino, CA (US);

Masato Horiike, Sunnyvale, CA (US);

Assignee:

Spansion LLC, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods of erasing a sector of multi-level flash memory cells (MLB) having three or more data states to a single data state are provided. The present invention employs an interactive sector erase algorithm that repeatedly erases, verifies, soft programs, and programs the sector in two or more erase phases to achieve highly compact data state distributions. In one example, the algorithm essentially erases all the MLB cells of the sector to an intermediate state and corresponding threshold voltage value using interactive erasing, soft programming and programming pulses in a first phase. Then in a second phase, the algorithm further erases all the MLB cells of the sector using additional interactive erasing and soft programming pulses until a final data state is achieved corresponding to a desired final threshold voltage value of the cells. Optionally, the algorithm may include one or more additional phases of similar operations that successively bring the memory cells of the sector to a compacted common erased state in preparation for subsequent programming operations. In one aspect of the method, the actual threshold values and/or data states chosen for these phases may be predetermined and input to the memory device by the user.


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