The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2007
Filed:
Jul. 28, 2006
Dar Bahatt, Foster City, CA (US);
Jerry E. Cahill, Trumble, CT (US);
Koichi Nishikida, Newton, CT (US);
Enrico G. Picozza, Hopkinton, MA (US);
Paul G. Saviano, Norwalk, CT (US);
David H. Tracy, Norwalk, CT (US);
Yongdong Wang, Wilton, CT (US);
Dar Bahatt, Foster City, CA (US);
Jerry E. Cahill, Trumble, CT (US);
Koichi Nishikida, Newton, CT (US);
Enrico G. Picozza, Hopkinton, MA (US);
Paul G. Saviano, Norwalk, CT (US);
David H. Tracy, Norwalk, CT (US);
Yongdong Wang, Wilton, CT (US);
Applera Corporation, Foster City, CA (US);
Abstract
An optical resonance analysis system comprising a sensor means () and an illumination means () for generating non-monochromatic illumination. The illumination means () further comprises a means for generating illumination at a plurality of angles, a lens system for projecting said illumination at said plurality of angles () and a dispersive device () for dispersing said illumination at each of said plurality of angles so that there is a correlation between said plurality of angles and the wavelengths of said illumination such that a resonance condition is generated on said sensor mean () for all wavelengths generated by said non-monochromatic source simultaneously. The analysis system also comprises a detection means () for detecting the reflected or transmitted illumination. Another embodiment comprises an anamorphic imaging means ().