The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2007
Filed:
Jun. 17, 2005
Hyoung-il Kim, Suwon-si, KR;
Kyung-pyo Kang, Suwon-si, KR;
Hyoung-il Kim, Suwon-si, KR;
Kyung-pyo Kang, Suwon-si, KR;
Samsung Electronics Co., Ltd, Suwon-Si, KR;
Abstract
A method for printing on a thermal medium by aligning test patterns comprises the steps of feeding a thermal medium to a print starting position of the medium beyond a predetermined distance from a heating elements of a thermal printhead; printing a first test pattern when a front edge of the medium is detected by an edge detection sensor; measuring a first distance between the front edge and the first test pattern by detecting the first test pattern using the edge detection sensor; rotating the thermal printhead to face the second surface; feeding the thermal medium to the print starting position of the medium is beyond predetermined distance the thermal printhead; printing a predetermined second test pattern when the front edge of the medium is detected by the edge detection sensor while feeding the medium; and measuring a second distance between the front edge and the second test pattern.