The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 31, 2007

Filed:

Nov. 21, 2005
Applicant:

Hee Wong, San Jose, CA (US);

Inventor:

Hee Wong, San Jose, CA (US);

Assignee:

National Semiconductor Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/84 (2006.01);
U.S. Cl.
CPC ...
Abstract

An analog-to-digital converter error detector suitable for single-chip control loop applications employs a single comparator determining the difference between an initial input voltage and a reference voltage in one or more conversion iterations, with the difference reduced in nonlinear steps during each conversion iteration based on the ratio between sampling and discharge capacitances. The number of conversion iterations required to reduce the initial input voltage to below the reference voltage is counted as representing the difference, with output codes representing the conversion iteration count having a step size increasing with the count value and selected to reduce downstream processing.


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