The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 31, 2007

Filed:

Jun. 19, 2006
Applicants:

William Lo, Cupertino, CA (US);

Yiging Guo, Cupertino, CA (US);

Tek Tsui, Sunnyvale, CA (US);

Tsin-ho Leung, San Jose, CA (US);

Runsheng He, Sunnyvale, CA (US);

Eric Janofsky, Sunnyvale, CA (US);

Inventors:

William Lo, Cupertino, CA (US);

Yiging Guo, Cupertino, CA (US);

Tek Tsui, Sunnyvale, CA (US);

Tsin-Ho Leung, San Jose, CA (US);

Runsheng He, Sunnyvale, CA (US);

Eric Janofsky, Sunnyvale, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/11 (2006.01);
U.S. Cl.
CPC ...
Abstract

A cable tester comprises a test initiating module that performs B cable tests. Each of said B cable tests includes selectively transmitting a test pulse on the cable, measuring a reflection amplitude, and calculating a cable length. A test results module determines a cable status for each of said B cable tests based on said measured amplitude and said calculated cable length and that determines an overall cable status of the cable based on the cable at least one of passing and failing A out of B cable tests. A and B are integers greater than zero and B is greater than A.


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