The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2007
Filed:
Feb. 25, 2005
Applicants:
Takuya Matsumoto, Kyoto, JP;
Yasuhisa Naitoh, Tsukuba, JP;
Tomoji Kawai, Mino, JP;
Inventors:
Assignee:
Osaka University, Suita-shi, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G21K 27/00 (2006.01); G01N 23/00 (2006.01); G01N 21/00 (2006.01); G01B 5/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
A probe device comprises a cantilever comprising a probe allocated to be opposed to a surface of a sample, means for feeding back a vibration amplitude value of the cantilever, thereby self-exciting and vibrating the cantilever at a predetermined frequency, means for applying a bias to the sample or the probe, and means for measuring a frequency shift caused by a charge-transfer force which acts between the cantilever and the sample.