The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2007
Filed:
May. 30, 2006
Applicants:
Edward Henry Chao, Oconomowoc, WI (US);
Bruce Matthew Dunham, Mequon, WI (US);
Inventors:
Edward Henry Chao, Oconomowoc, WI (US);
Bruce Matthew Dunham, Mequon, WI (US);
Assignee:
General Electric Company, Schenectady, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for measuring focal spot shape of a radiation beam from a radiation source includes collimating the radiation beam using a collimator having a well-defined edge, measuring an intensity profile of the collimated radiation beam, determining a function of the measured intensity profile, and determining a metric of the of the focal spot using the determined function of the measured intensity profile.