The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2007
Filed:
Aug. 27, 2003
Toshifumi Mihashi, Tokyo, JP;
Yoko Hirohara, Tokyo, JP;
Toshifumi Mihashi, Tokyo, JP;
Yoko Hirohara, Tokyo, JP;
Kabushiki Kaisha Topcon, Tokyo, JP;
Abstract
Measurement of an eye characteristic is performed more accurately and at high speed by setting a measurement condition of a light receiving optical system with a long focal point or high sensitivity on the basis of an optical characteristic measured by a light receiving optical system with a short focal point or low sensitivity or high density. The optical characteristic of the subject eye is obtained on the basis of an output of a first light receiving part and/or a second light receiving part, and a change direction of the beam is estimated on the basis of an output signal from the second light receiving part.