The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 31, 2007

Filed:

Sep. 15, 2006
Applicants:

Li-yan Zhu, San Jose, CA (US);

Gautham Gowda, Milpitas, CA (US);

Chao-hui Yang, Milpitas, CA (US);

Inventors:

Li-Yan Zhu, San Jose, CA (US);

Gautham Gowda, Milpitas, CA (US);

Chao-Hui Yang, Milpitas, CA (US);

Assignee:

SAE Magnetics (HK) Ltd., Shatin, N.T., HK;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 7/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A device is provided by which the stiffness coefficient of a flexure, in either a pitch or roll direction, can be measured while a slider is mounted thereon and while the flexure and slider are in a loaded condition as might be obtained during normal operational conditions of a HGA in a HDA. There are two methods of making the measurement, a static method in which the slider is loaded by an external weight called a pendulum and the angular displacement of the slider is measured, and a dynamical method in which the pendulum is caused to oscillate while in contact with the slider and its natural and loaded frequencies of oscillation are measured.


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